Producing modular products that combine modules with the consideration of product performance, e.g., testability of electronic systems, is frequently stated as a design goal. However, most of mechatronic frameworks (models) discussed in the literature do not consider testability of electronic subsystems of mechatronic products. This paper assumes that the product modules have been established, and aims at the development of modular mechatronic products with the consideration of testability of electronic subsystems as a performance criterion. The generation of modular products and module testability issues are discussed. Testability points, testability values, and access paths for a module/system are crucial to the generation of modular mechatronic products. A generalized label-correcting algorithm is developed to determine the points of focus, testability values, and access paths in modules. This paper contributes to the development of modular mechatronic products with the consideration of testability of electronic subsystems.
Journal article
Synthesis of modular mechatronic products: a testability perspective
IEEE/ASME Transactions on Mechatronics, Vol.4(2), pp.119-132
1999
DOI: 10.1109/3516.769539
Abstract
Details
- Title: Subtitle
- Synthesis of modular mechatronic products: a testability perspective
- Creators
- Chun-Che HuangAndrew Kusiak - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE/ASME Transactions on Mechatronics, Vol.4(2), pp.119-132
- DOI
- 10.1109/3516.769539
- ISSN
- 1083-4435
- Language
- English
- Date published
- 1999
- Academic Unit
- Industrial and Systems Engineering; Nursing
- Record Identifier
- 9983557503402771
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