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Temperature Dependence of Wavelength Selectable Zero-Phonon Emission from Single Defects in Hexagonal Boron Nitride
Journal article   Peer reviewed

Temperature Dependence of Wavelength Selectable Zero-Phonon Emission from Single Defects in Hexagonal Boron Nitride

Nicholas R Jungwirth, Brian Calderon, Yanxin Ji, Michael G Spencer, Michael E Flatté and Gregory D Fuchs
Nano letters, Vol.16(10), pp.6052-6057
10/12/2016
DOI: 10.1021/acs.nanolett.6b01987
PMID: 27580074
url
https://arxiv.org/pdf/1605.04445View
Open Access

Abstract

We investigate the distribution and temperature-dependent optical properties of sharp, zero-phonon emission from defect-based single photon sources in multilayer hexagonal boron nitride (h-BN) flakes. We observe sharp emission lines from optically active defects distributed across an energy range that exceeds 500 meV. Spectrally resolved photon-correlation measurements verify single photon emission, even when multiple emission lines are simultaneously excited within the same h-BN flake. We also present a detailed study of the temperature-dependent line width, spectral energy shift, and intensity for two different zero-phonon lines centered at 575 and 682 nm, which reveals a nearly identical temperature dependence despite a large difference in transition energy. Our temperature-dependent results are well described by a lattice vibration model that considers piezoelectric coupling to in-plane phonons. Finally, polarization spectroscopy measurements suggest that whereas the 575 nm emission line is directly excited by 532 nm excitation, the 682 nm line is excited indirectly.
2D material zero-phonon line point defect Single-photon source hexagonal boron nitride line width

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