Logo image
Temperature-dependent optical measurements of the dominant recombination mechanisms in InAs/InAsSb type-2 superlattices
Journal article   Open access   Peer reviewed

Temperature-dependent optical measurements of the dominant recombination mechanisms in InAs/InAsSb type-2 superlattices

Y. Aytac, B. V. Olson, J. K. Kim, E. A. Shaner, S. D. Hawkins, J. F. Klem, M. E. Flatte and T. F. Boggess
Journal of applied physics, Vol.118(12), 125701
09/28/2015
DOI: 10.1063/1.4931419
url
https://www.osti.gov/biblio/1496990View
Open Access

Abstract

Temperature-dependent measurements of carrier recombination rates using a time-resolved optical pump-probe technique are reported for mid-wave infrared InAs/InAs1-xSbx type-2 superlattices (T2SLs). By engineering the layer widths and alloy compositions, a 16K band-gap of similar to 235 +/- 10 meV was achieved for five unintentionally and four intentionally doped T2SLs. Carrier lifetimes were determined by fitting lifetime models based on Shockley-Read-Hall (SRH), radiative, and Auger recombination processes to the temperature and excess carrier density dependent data. The minority carrier (MC), radiative, and Auger lifetimes were observed to generally increase with increasing antimony content and decreasing layer thickness for the unintentionally doped T2SLs. The MC lifetime is limited by SRH processes at temperatures below 200K in the unintentionally doped T2SLs. The extracted SRH defect energy levels were found to be near mid-bandgap. Also, it is observed that the MC lifetime is limited by Auger recombination in the intentionally doped T2SLs with doping levels greater than n similar to 10(16) cm(-3). (C) 2015 AIP Publishing LLC.
Physical Sciences Physics Physics, Applied Science & Technology

Details

Metrics

Logo image