Test: Wisdom From the Giants, Visions for the Future-Part 1

K Fuchs; J A Abraham; V D Agrawal; W R Bottoms; M Breuer; W Maly; S M Reddy; T W Williams; D Yeh

doi:10.1109/MDAT.2015.2482700

Back

Test: Wisdom From the Giants, Visions for the Future-Part 1

Journal article

Open access

Peer reviewed

Test: Wisdom From the Giants, Visions for the Future-Part 1

K Fuchs, J A Abraham, V D Agrawal, W R Bottoms, M Breuer, W Maly, S M Reddy, T W Williams and D Yeh

IEEE DESIGN & TEST, Vol.32(6), pp.99-107

2015

DOI: 10.1109/MDAT.2015.2482700

Files and links (1)

url

https://doi.org/10.1109/MDAT.2015.2482700View

Published (Version of record) Open Access

Abstract

This article featured the speakers of the 'Wisdom from the Giants' plenary session held at the 2014 International Test Week. Panelists, with combined experience of more than 200 years of among them, offered their perspectives at this session on how test had featured significantly in the semiconductor industry's success. Panelists also discussed ways in which test would play a larger role as electronics become more pervasive with the emergence of wearables, automotive 'systems of systems', biomedical applications, and the Internet of Things.

Details

Title: Subtitle: Test: Wisdom From the Giants, Visions for the Future-Part 1
Creators: K Fuchs
J A Abraham
V D Agrawal
W R Bottoms
M Breuer
W Maly
S M Reddy
T W Williams
D Yeh
Resource Type: Journal article
Publication Details: IEEE DESIGN & TEST, Vol.32(6), pp.99-107
DOI: 10.1109/MDAT.2015.2482700
ISSN: 2168-2356
Language: English
Date published: 2015
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984231870802771

Metrics

6 Record Views