Journal article
Test compaction for at-speed testing of scan circuits based on nonscan test. sequences and removal of transfer sequences
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.21(6), pp.706-714
06/2002
DOI: 10.1109/TCAD.2002.1004314
Abstract
Proposes a procedure for generating compact test sets with enhanced at-speed testing capabilities for scan circuits. Compaction refers here to a reduction in the test application time, while at-speed testing refers to the application of primary input sequences that contribute to the detection. of delay defects. The proposed procedure generates an initial test set that has a low test application time and consists of long sequences of primary input vectors applied consecutively. To construct this test set, the proposed procedure transforms a test sequence T/sub o/ for the nonscan circuit into a scan-based test by selecting an appropriate scan-in state and removing primary input vectors from T/sub o/ if they do not contribute to the fault coverage. If T/sub o/ contains long transfer sequences, several scan-based tests with long primary input sequences may be obtained by replacing transfer sequences in T/sub o/ with scan operations. This helps reduce the test application time further. We demonstrate through experimental results the advantages of this approach over earlier ones as a method for generating test sets with minimal test application time and long primary input sequences.
Details
- Title: Subtitle
- Test compaction for at-speed testing of scan circuits based on nonscan test. sequences and removal of transfer sequences
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.21(6), pp.706-714
- DOI
- 10.1109/TCAD.2002.1004314
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Publisher
- IEEE
- Language
- English
- Date published
- 06/2002
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197420202771
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