Sign in
Tests of the methods of analysis of picosecond lifetimes and measurement of the half-life of the 569.6 keV level in 207Pb
Journal article

Tests of the methods of analysis of picosecond lifetimes and measurement of the half-life of the 569.6 keV level in 207Pb

E de Lima, H Kawakami, A de Lima, R Hichwa, A.V Ramayya, J.H Hamilton, W Dunn and H.J Kim
Nuclear instruments & methods, Vol.151(1), pp.221-225
1978
DOI: 10.1016/0029-554X(78)90492-5

View Online

Abstract

Details

Metrics