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The Relationship Between Item Exposure and Test Overlap in Computerized Adaptive Testing
Journal article   Peer reviewed

The Relationship Between Item Exposure and Test Overlap in Computerized Adaptive Testing

Shu-Ying Chen, Robert D. Ankenmann and Judith A. Spray
Journal of educational measurement, Vol.40(2), pp.129-145
06/2003
DOI: 10.1111/j.1745-3984.2003.tb01100.x

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