Journal article
Theory of a Scanning Tunneling Microscope with a Two-Protrusion Tip
Physical review. B, Condensed matter, Vol.53(16), pp.R10536-R10539
04/15/1996
DOI: 10.1103/PhysRevB.53.R10536
PMID: 9982725
Abstract
We consider a scanning tunneling microscope (STM) such that tunneling occurs through two atomically sharp protrusions on its tip. When the two protrusions are separated by at least several atomic spacings, the differential conductance of this STM depends on the electronic transport in the sample between the protrusions. Such two-protrusion tips commonly occur during STM tip preparation. We explore possible applications to probing dynamical impurity potentials on a metallic surface and local transport in an anisotropic superconductor.
Details
- Title: Subtitle
- Theory of a Scanning Tunneling Microscope with a Two-Protrusion Tip
- Creators
- Michael E Flatté - Physics and AstronomyJeff M Byers
- Resource Type
- Journal article
- Publication Details
- Physical review. B, Condensed matter, Vol.53(16), pp.R10536-R10539
- DOI
- 10.1103/PhysRevB.53.R10536
- PMID
- 9982725
- NLM abbreviation
- Phys Rev B Condens Matter
- ISSN
- 0163-1829
- eISSN
- 1095-3795
- Publisher
- American Physical Society
- Language
- English
- Date published
- 04/15/1996
- Academic Unit
- Electrical and Computer Engineering; Physics and Astronomy
- Record Identifier
- 9984429058302771
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