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Top-level design and preliminary physical analysis for the first electron-beam micro-CT scanner
Journal article   Peer reviewed

Top-level design and preliminary physical analysis for the first electron-beam micro-CT scanner

Ge Wang, Yinong Liu, Yangbo Ye, Shiying Zhao, Jiang Hsieh and Shuping Ge
Journal of X-ray science and technology, Vol.12(4), pp.251-260
01/01/2004

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Abstract

Instruments & Instrumentation Optics Physical Sciences Physics Physics, Applied Science & Technology Technology

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