Journal article
Transparent-Segmented-Scan without the Routing Overhead of Segmented-Scan
Journal of low-power electronics, Vol.7(2), pp.245-253
2011
DOI: 10.1166/jolpe.2011.1132
Abstract
We introduce a combination of segmented-scan and transparent-scan referred to as transparentsegmentedscan. Segmented-scan is a design-for-testability approach for reducing the power dissipation of scan-based tests. Transparent-scan is a test application scheme that was proposed as a way to obtain highly compacted test sequences. The combination allows the generation of compact test sequences with reduced power dissipation. Moreover, since transparent-scan views scan shift and functional capture cycles uniformly, both scan shift and functional capture power are reduced together. We explore a particular implementation of transparent-segmented-scan that does not require the scan chain input and output to be routed to all the segments of a scan chain, as in segmented-scan. This avoids the routing overhead of segmented-scan. It is made possible by the properties of transparent-scan that also contribute to test compaction. Copyright © 2011 American Scientific Publishers All rights reserved.
Details
- Title: Subtitle
- Transparent-Segmented-Scan without the Routing Overhead of Segmented-Scan
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- Journal of low-power electronics, Vol.7(2), pp.245-253
- DOI
- 10.1166/jolpe.2011.1132
- ISSN
- 1546-1998
- eISSN
- 1546-2005
- Publisher
- American Scientific Publishers
- Language
- English
- Date published
- 2011
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197214602771
Metrics
25 Record Views