Two-dimensional partially functional broadside tests

I Pomeranz; S. M Reddy

doi:10.1049/iet-cdt.2009.0022

Back

Two-dimensional partially functional broadside tests

Journal article

Peer reviewed

Two-dimensional partially functional broadside tests

I Pomeranz and S. M Reddy

IET computers & digital techniques, Vol.5(4), pp.247-253

2011

DOI: 10.1049/iet-cdt.2009.0022

View Online

Abstract

Partially functional broadside tests were defined to address the tradeoff that exists between fault coverage and proximity to functional operation conditions during the application of scan-based tests for delay faults. Proximity to functional operation conditions is important for avoiding overtesting. The definition of a partially functional broadside test does not take into consideration the extent of deviation from functional operation conditions that occurs during the second pattern of a test. The authors define two-dimensional partially functional broadside tests to address this issue. The authors demonstrate through experimental results that this improves the ability of the test to remain close to functional operation conditions during the application of both patterns. © 2011 The Institution of Engineering and Technology.

Applied Sciences

Circuit properties

Digital circuits

Electric, optical and optoelectronic circuits

Electronic circuits

Electronics

Exact sciences and technology

Testing, measurement, noise and reliability

Details

Title: Subtitle: Two-dimensional partially functional broadside tests
Creators: I Pomeranz - Purdue University West Lafayette
S. M Reddy - University of Iowa
Resource Type: Journal article
Publication Details: IET computers & digital techniques, Vol.5(4), pp.247-253
DOI: 10.1049/iet-cdt.2009.0022
ISSN: 1751-8601
eISSN: 1751-861X
Publisher: Institution of Engineering and Technology
Language: English
Date published: 2011
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197315202771

Metrics

20 Record Views