Journal article
Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits
ACM transactions on design automation of electronic systems, Vol.15(1), pp.1-22
12/2009
DOI: 10.1145/1640457.1640464
Abstract
In enhanced-scan circuits, a two-pattern test < t i , t j > for a transition fault can be obtained by using a test t j that detects a stuck-at fault, and preceding it by a test t i that activates another stuck-at fault. Thus, test generation for transition faults can be done by combining pairs of stuck-at tests. This provides an alternative to deterministic test generation, as well as reduces the test storage requirements for transition fault tests. We study the possibility of generating scan-based tests for transition faults in standard-scan circuits in a similar way, by combining pairs of stuck-at tests. Since it is not always possible to obtain a standard-scan test that is equivalent to a two-pattern test < t i , t j > based on stuck-at tests t i and t j , it is not always possible to guarantee that the combination of t i and t j will detect a transition fault. To compensate for this, it is necessary to try combinations of different stuck-at test pairs, resulting in an increased simulation effort to compute effective standard-scan tests. Our focus in this work is on reducing this simulation effort by reducing the number of stuck-at test pairs that need to be considered.
Details
- Title: Subtitle
- Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- ACM transactions on design automation of electronic systems, Vol.15(1), pp.1-22
- DOI
- 10.1145/1640457.1640464
- ISSN
- 1084-4309
- eISSN
- 1557-7309
- Grant note
- DOI: 10.13039/100000028, name: Semiconductor Research Corporation, award: 2007-TJ-16432007-TJ-1642
- Language
- English
- Date published
- 12/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197187602771
Metrics
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