Journal article
Vector replacement to improve static-test compaction for synchronous sequential circuits
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.20(2), pp.336-342
02/2001
DOI: 10.1109/43.908476
Abstract
Static-test compaction procedures for synchronous sequential circuits may saturate and be unable to further reduce the test-sequence length before the test length reaches its minimum value, resulting in test sequences that may be longer than necessary. We propose a method to take a static-compaction procedure out of saturation and allow it to continue reducing the test-sequence length. The proposed method is based on the replacement of test vectors in the test sequence every time the compaction procedure reaches saturation. Test-vector replacement is done such that the fault coverage of the sequence is maintained. Experimental results using an effective static-compaction procedure demonstrate that reductions in test length can be obtained by the proposed vector replacement method.
Details
- Title: Subtitle
- Vector replacement to improve static-test compaction for synchronous sequential circuits
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.20(2), pp.336-342
- DOI
- 10.1109/43.908476
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Publisher
- IEEE
- Language
- English
- Date published
- 02/2001
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197439202771
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