Journal article
n-pass n-detection fault simulation and its applications
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.21(8), pp.980-986
08/2002
DOI: 10.1109/TCAD.2002.800453
Abstract
An n-detection fault simulation process called n-pass n-detection fault simulation is described. n-pass n-detection fault simulation can be implemented such that it has the same computational complexity (and run time) as the conventional n-detection fault simulation process; however, it is more effective for applications where it is necessary to identify tests that detect large numbers of faults. One such application considered in this work is that of ordering a given test set so as to steepen its fault coverage curve. Experimental results are presented to demonstrate that improved test ordering is obtained by using the proposed n-pass n-detection fault simulation process using approximately the same run time as when conventional n-detection fault simulation is used. n-pass n-detection fault simulation is also effective in cases where the value of n is required to change dynamically during the fault simulation process. This is useful in order to accommodate a limit on the run time of n-detection fault simulation, or when it is not possible to specify a value for n in advance.
Details
- Title: Subtitle
- n-pass n-detection fault simulation and its applications
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.21(8), pp.980-986
- DOI
- 10.1109/TCAD.2002.800453
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Publisher
- IEEE
- Language
- English
- Date published
- 08/2002
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197432302771
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