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Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions
Letter/Communication

Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions

Sudhakar M Reddy and James R Wilson
IEEE transactions on computers, Vol.C-23(1), pp.98-100
01/1974
DOI: 10.1109/T-C.1974.223787

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Abstract

Networks to realize all n-variable symmetric threshold functions and elementary symmetric functions are given. It is also shown that only 2n test inputs are necessary and sufficient to test any number of faults in these networks.
Easily testable networks multiple faults single faults stuck-at-faults symmetric functions threshold functions

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