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Provided are methods for determining optimal features for classifying patterns or objects. Also provided are methods for image analysis. Further provided are methods for image searching.
Patent
Methods and systems for determining optimal features for classifying patterns or objects in images
United States Patent and Trademark Office
12/25/2012
Abstract
Details
- Title: Subtitle
- Methods and systems for determining optimal features for classifying patterns or objects in images
- Creators
- Michael Abràmoff (Inventor)Pete Soliz (Inventor)Stephen Russell (Inventor)
- Contributors
- University of Iowa Research Foundation (Iowa City, IA, US) (Assignee)
- Resource Type
- Patent
- Publisher
- United States Patent and Trademark Office; United States
- Patent
- US Patent 8,340,437; United States Patent and Trademark Office (United States, Alexandria) - USPTO; Published; 12/601,784; 05/29/2008
- Number of pages
- 31 pages
- Language
- English
- Date published
- 12/25/2012
- Academic Unit
- UI Research Foundation; Roy J. Carver Department of Biomedical Engineering; Electrical and Computer Engineering; Ophthalmology and Visual Sciences
- Record Identifier
- 9983761997202771
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